Overview

The conference ESSDERC '89 held in September 1989 in Berlin was concerned with the physics, electrical characteristics, reliability and processing of solid state devices and electronic materials. The proceedings contain all invited and contributed papers of the conference and thus becomes a state-of-the-art-report of solid state device research in Europe 1989.

Full Product Details

Author:   Anton Heuberger ,  Heiner Ryssel ,  Peter Lange
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   Softcover reprint of the original 1st ed. 1989
Dimensions:   Width: 15.50cm , Height: 5.00cm , Length: 23.50cm
Weight:   1.496kg
ISBN:  

9783642523168

ISBN 10:   3642523161
Pages:   963
Publication Date:   01 July 2012
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand  
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Table of Contents

From the Contents: Silicon and Compound Semiconductor Devices: MOS and Bipolar Structures.- New Devices, Submicron Devices.- III-V and II-VI Devices.- Quantum Well Devices and Heterostructures.- Lasers and Photodetectors.- Integrated Optoelectronics.- Sensors.- Cryogenic Devices.- Device Modelling.- Device Characterization.- Radiation Damage, Radiation Hardening.- Superconductivity in Semiconductor Devices.- Silicon and Compound Semiconductor Technology: Technology on III-V and II-VI Compounds.- Epitaxy Processes (LPE, MBE, MO-CVD,...).- Deposition Processes.- Plasma Processes.- Rapid Thermal Annealing.- Submicron Lithography.- Passivation.- Non-destructive Testing of Wafers, Layers, Devices.- Reliability and Defects.- Process Modelling.

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