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OverviewElectrostatic discharge (ESD) effects in silicon integrated circuits have become a major concern as high circuit density technologies shrink to sub-micron dimensions. This update of a classic reference provides a complete and current overview of ESD and its implications in the design and development of new semiconductor technologies and integrated circuits. Full Product DetailsAuthor: E a Amerasekera , Charvaka DuvvuryPublisher: John Wiley & Sons Imprint: John Wiley & Sons ISBN: 9786610554720ISBN 10: 6610554722 Pages: 421 Publication Date: 07 June 2002 Audience: General/trade , General Format: Electronic book text Publisher's Status: Unknown Availability: Out of stock  Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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