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OverviewFull Product DetailsAuthor: Eishi H. IbePublisher: John Wiley & Sons Inc Imprint: Wiley-IEEE Press Dimensions: Width: 17.50cm , Height: 2.00cm , Length: 24.90cm Weight: 0.599kg ISBN: 9781118479292ISBN 10: 1118479297 Pages: 296 Publication Date: 13 February 2015 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Out of stock  The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviewsAuthor InformationEishi, H. Ibe, Chief Researcher, Yokohama Research Laboratory, Hitachi, Ltd. Dr.Eishi Hidefumi IBE received his Ph.D degree in Nuclear Engineering from Osaka University, Japan in 1985. His expertise covers a wide area of science, such as elementary particle/cosmic ray physics, nuclear /neutron physics, semiconductor physics, mathematics and computing technologies, ion-implantation/mixing and accelerator technologies, electro-chemistry, data-base handling, and BS/Auger/SEM/ Laser-beam micro analysis. He has authored more than 90 international technical papers and presentations including 22 invited contributions in the field of radiation effects. Dr.Ibe was elevated to IEEE Fellow for contributions to analysis of soft-errors in memory devices in 2008. Tab Content 6Author Website:Countries AvailableAll regions |
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