Electronics Reliability and Measurement Technology: Nondestructive Evaluation
Author:   Joseph S. Heyman ,  Joseph S. Heyman
Publisher:   William Andrew Publishing
ISBN:  

9780815511717


Pages:   140
Publication Date:   31 December 1998
Format:   Hardback
Availability:   In Print   Availability explained
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.

Our Price $382.80 Quantity:  
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Electronics Reliability and Measurement Technology: Nondestructive Evaluation


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Author:   Joseph S. Heyman ,  Joseph S. Heyman
Publisher:   William Andrew Publishing
Imprint:   William Andrew Publishing
Dimensions:   Width: 15.20cm , Height: 0.90cm , Length: 22.90cm
Weight:   0.490kg
ISBN:  

9780815511717


ISBN 10:   081551171
Pages:   140
Publication Date:   31 December 1998
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Out of Print
Availability:   In Print   Availability explained
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.

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