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OverviewEfficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques. Full Product DetailsAuthor: Dongwoo Hong , Kwang-Ting ChengPublisher: Springer Imprint: Springer Edition: 2010 ed. Volume: 51 Dimensions: Width: 15.50cm , Height: 0.70cm , Length: 23.50cm Weight: 0.750kg ISBN: 9789048134427ISBN 10: 9048134420 Pages: 98 Publication Date: 07 December 2009 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsAn Efficient Jitter Measurement Technique.- BER Estimation for Linear Clock and Data Recovery Circuit.- BER Estimation for Non-linear Clock and Data Recovery Circuit.- Gaps in Timing Margining Test.- An Accurate Jitter Estimation Technique.- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers.- Conclusions.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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