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OverviewBranch-and-bound search has been known for a long time and has been widely used in solving a variety of problems in computer-aided design (CAD) and many important optimization problems. In many applications, the classic branch-and-bound search methods perform duplications of computations, or rely on the search decision trees which keep track of the branch-and-bound search processes. In CAD and many other technical fields, the computational cost of constructing branch-and-bound search decision trees in solving large-scale problems is prohibitive and duplications of computations are intolerable. Efficient branch-and-bound methods are needed to deal with today's computational challenges. Efficient branch-and-bound methods must not duplicate computations. This volume describes an efficient branch-and-bound method for logic justification, which is fundamental to automatic test pattern generation (ATPG), redundancy identification, logic synthesis, minimization, verification and other problems in CAD. The method is called justification equivalence, based on the observation that justification processes may share identical subsequent search decision sequences. With justification equivalence, duplication of computations is avoided in the dynamic branch-and-bound search process without using search decision trees. This book consists of two parts. The first part, containing the first three chapters, provides the theoretical work. The second part deals with applications, particularly ATPG for sequential circuits. This book is intended, in particular, for those readers who are interested in the design and testing of digital circuits. Full Product DetailsAuthor: Xinghao Chen , Michael L. BushnellPublisher: Kluwer Academic Publishers Imprint: Kluwer Academic Publishers Edition: 1996 ed. Volume: 4 Dimensions: Width: 15.60cm , Height: 1.10cm , Length: 23.40cm Weight: 0.910kg ISBN: 9780792396734ISBN 10: 0792396731 Pages: 146 Publication Date: 31 December 1995 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsI Theory.- 1 Introduction.- 2 Justification Equivalence.- 3 Justification in Finite State Space.- II Applications.- 4 Sequential Circuit Test Generation.- 5 Fault Effects.- 6 The Sest Algorithm.- 7 Experimental Results.- 8 Redundancy Identification.- 9 Logic Verification.- 10 Conclusion.- A Sest User’s Guide.- A.1 Introduction.- A.2 Command Synopsis.- A.3 Options.- A.4 Inputs and Outputs.- A.5 Output Files.- A.6 Example.- A.7 Down-Loading SEST from the Disk.- A.8 Reporting Bugs.- A.9 Author.- References.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |