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OverviewFull Product DetailsAuthor: Xinghao Chen , Michael L. BushnellPublisher: Kluwer Academic Publishers Imprint: Kluwer Academic Publishers Edition: 1996 ed. Volume: 4 Dimensions: Width: 15.60cm , Height: 1.10cm , Length: 23.40cm Weight: 0.910kg ISBN: 9780792396734ISBN 10: 0792396731 Pages: 146 Publication Date: 31 December 1995 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsI Theory.- 1 Introduction.- 2 Justification Equivalence.- 3 Justification in Finite State Space.- II Applications.- 4 Sequential Circuit Test Generation.- 5 Fault Effects.- 6 The Sest Algorithm.- 7 Experimental Results.- 8 Redundancy Identification.- 9 Logic Verification.- 10 Conclusion.- A Sest User’s Guide.- A.1 Introduction.- A.2 Command Synopsis.- A.3 Options.- A.4 Inputs and Outputs.- A.5 Output Files.- A.6 Example.- A.7 Down-Loading SEST from the Disk.- A.8 Reporting Bugs.- A.9 Author.- References.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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