Overview

This volume provides a collection of research contributions derived from the Second Workshop on Economics of Design, Manufacture and Test. It explores the question of economics in the context of electronic design. The general understanding of design is that it should lead to a manufacturable product. Neither the design nor the process of manufacturing is perfect. As a result, the product will be faulty, will require testing and fixing. As there is a cost involved with finding and eliminating the causes of faults, there are, in fact, two costs: the cost of testing and fixing and the cost of finding and eliminating causes of faults. Both costs, in some way, are included in the overall cost of the product. If either cost is eliminated, the other cost goes up. This book looks at how an economic system of production could minimize the overall cost of the product.

Full Product Details

Author:   M. Abadir ,  T. Ambler
Publisher:   Springer
Imprint:   Springer
Edition:   Reprinted from JOURNAL OF ELECTRONIC TESTING: THEORY & APPLICATION, 5:2-3, 1994
Weight:   0.793kg
ISBN:  

9780792394716

ISBN 10:   0792394712
Pages:   192
Publication Date:   30 September 1994
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock  
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Table of Contents

A Tale of Two Designs: the Cheapest and the Most Economic.- Test Strategy Planning Using Economic Analysis.- Economic Modeling of Board Test Strategies.- Economics of “Design for Test” to Remain Competitive in The 90s.- The Economics of Scan-Path Design for Testability.- High Level Test Economics Advisor (Hi-TEA).- Multichip Systems Tradeoff Analysis Tool.- Trade-Off Analysis on Cost and Manufacturing Technology of an Electronic Product: Case Study.- Cost Based Surface Mount PCB Design Evaluation.- Sensitivity Analysis in Economics Based Test Strategy Planning.- Improving Quality: Yield Versus Test Coverage.- Boundary Scan in Board Manufacturing.- Comparing Quality Assurance Methods and the Resulting Design Strategies: Experiences from Complex Designs.- Trade-Offs in Scan Path and BIST Implementations for RAMs.- Techniques for Estimating Test Length Under Random Test.- Fuzzy Optimization Models for Analog Test Decisions.- Self-Test of Sequential Circuits with Deterministic Test Pattern Sequences.

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