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Full Product Details

Author:   Krishnendu Chakrabarty (Duke University, USA.) ,  Fei Su (Intel Corporation, Folsom, California, USA)
Publisher:   Taylor & Francis Inc
Imprint:   CRC Press Inc
Dimensions:   Width: 15.60cm , Height: 1.90cm , Length: 23.40cm
Weight:   0.476kg
ISBN:  

9780849390098

ISBN 10:   0849390095
Pages:   244
Publication Date:   10 October 2006
Audience:   Professional and scholarly ,  Professional and scholarly ,  Professional & Vocational ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

Synthesis Techniques. Testing Techniques. Reconfiguration-Based Defect Tolerance.

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Krishnendu Chakrabarty, Fei Su

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