Overview

Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a

Full Product Details

Author:   Eugene R. Hnatek
Publisher:   Van Nostrand Reinhold Inc.,U.S.
Imprint:   Van Nostrand Reinhold Inc.,U.S.
Edition:   1993 ed.
Dimensions:   Width: 15.60cm , Height: 1.20cm , Length: 23.40cm
Weight:   1.000kg
ISBN:  

9780442006433

ISBN 10:   0442006438
Pages:   180
Publication Date:   31 August 1993
Audience:   College/higher education ,  Professional and scholarly ,  General/trade ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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