Free Delivery Over $100
|
|
|||
|
||||
OverviewDesign for Manufacturability and Statistical Design: A Constructive Approach provides a thorough treatment of the causes of variability, methods for statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design and design for manufacturability from device physics to large-scale circuit optimization. The segments of the book are devoted, respectively, to understanding the causes of variability; design of test structures for variability characterization; statistically rigorous data analysis; techniques of design for manufacturability in lithography and in chemical mechanical polishing; statistical simulation, analysis, and optimization techniques for improving parametric yield. Design for Manufacturability and Statistical Design: A Constructive Approach presents an overview of the methods that need to be mastered for state-of-the-art design for manufacturability and statistical design methodologies. It is an important reference for practitioners and students in the field of computer-aided design of integrated circuits. Full Product DetailsAuthor: Michael Orshansky , Sani Nassif , Duane BoningPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: Softcover reprint of hardcover 1st ed. 2008 Dimensions: Width: 15.50cm , Height: 1.70cm , Length: 23.50cm Weight: 0.510kg ISBN: 9781441940445ISBN 10: 1441940448 Pages: 316 Publication Date: 24 November 2010 Audience: Professional and scholarly , Professional & Vocational , Postgraduate, Research & Scholarly Format: Paperback Publisher's Status: Active Availability: Out of print, replaced by POD  We will order this item for you from a manufatured on demand supplier. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
||||
