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OverviewIn 2007 The Design, Automation and Test in Europe (DATE) conference celebrated its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry. Full Product DetailsAuthor: Rudy Lauwereins , Jan MadsenPublisher: Springer Imprint: Springer ISBN: 9786611180102ISBN 10: 6611180109 Pages: 499 Publication Date: 01 January 2008 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: Out of stock The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |