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OverviewThe Design Automation and Test in Europe, DATE, is Europe’s leading international electronic systems design conference for electronic design, automation and test, from system level hardware and software implementation right down to integrated circuit design. It combines the conference with Europe’s leading international ex- bition for electronic design, automation and test. To celebrate the tenth anniversary of DATE, we have compiled this book with the aim to highlight some of the most influential technical contributions from ten years of DATE. Selecting 30 papers, only 3 papers from each year, is a challenging endeavor. Although the impact of papers from the first years of DATE can be det- mined through various citation indexes, the impact from the later years still have to be seen. Together with all 10 Program Chairs, we have made a selection of the most influential papers covering the very broad range of topics which is characteristic for DATE. Full Product DetailsAuthor: Rudy Lauwereins , Jan MadsenPublisher: Springer Imprint: Springer Edition: Softcover reprint of hardcover 1st ed. 2008 Dimensions: Width: 15.50cm , Height: 2.70cm , Length: 23.50cm Weight: 0.801kg ISBN: 9789048176533ISBN 10: 9048176530 Pages: 516 Publication Date: 19 October 2010 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsSystem Level Design.- System Level Design: Past, Present, and Future.- Scheduling of Conditional Process Graphs for the Synthesis of Embedded Systems.- EXPRESSION: A Language for Architecture Exploration Through Compiler/Simulator Retargetability.- RTOS Modeling for System Level Design.- Context-Aware Performance Analysis for Efficient Embedded System Design.- Lock-Free Synchronization for Dynamic Embedded Real-Time Systems.- What If You Could Design Tomorrow’s System Today?.- Networks on Chip.- Networks on Chips.- A Generic Architecture for On-Chip Packet-Switched Interconnections.- Trade-offs in the Design of a Router with Both Guaranteed and Best-Effort Services for Networks on Chip.- Exploiting the Routing Flexibility for Energy/Performance-Aware Mapping of Regular NoC Architectures.- xpipesCompiler: A Tool for Instantiating Application-Specific Networks on Chip.- A Network Traffic Generator Model for Fast Network-on-Chip Simulation.- Modeling, Simulation and Run-Time Management.- Modeling, Simulation and Run-Time Management.- Dynamic Power Management for Nonstationary Service Requests.- Quantitative Comparison of Power Management Algorithms.- Energy Efficiency of the IEEE 802.15.4 Standard in Dense Wireless Microsensor Networks: Modeling and Improvement Perspectives.- Statistical Blockade: A Novel Method for Very Fast Monte Carlo Simulation of Rare Circuit Events, and its Application.- Compositional Specification of Behavioral Semantics.- Design Technology for Advanced Digital Systems in CMOS and Beyond.- Design Technology for Advanced Digital Systems in CMOS and Beyond.- Address Bus Encoding Techniques for System-Level Power Optimization.- MOCSYN: Multiobjective Core-Based Single-Chip System Synthesis.- Minimum Energy Fixed-Priority Scheduling for VariableVoltage Processors.- Synthesis and Optimization of Threshold Logic Networks with Application to Nanotechnologies.- Physical Design and Validation.- Physical Design and Validation.- Interconnect Tuning Strategies for High-Performance ICs.- Efficient Inductance Extraction via Windowing.- Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits.- A Single Photon Avalanche Diode Array Fabricated in Deep-Submicron CMOS Technology.- Test and Verification.- The Test and Verification Influential Papers in the 10 Years of DATE.- Cost Reduction and Evaluation of a Temporary Faults-Detecting Technique.- An Integrated System-on-Chip Test Framework.- Efficient Spectral Techniques for Sequential ATPG.- BerkMin: A Fast and Robust Sat-Solver.- Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-Chip Test Data Compression/Decompression.- An Effective Technique for Minimizing the Cost of Processor Software-Based Diagnosis in SoCs.ReviewsAuthor InformationDr. Rudy Lauwereins is the General Chair for DATE 2007, Dr. Jan Madsen is the Technical Chair. Tab Content 6Author Website:Countries AvailableAll regions |
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