Design and Test Technology for Dependable Systems-on-Chip
Author:   Raimund Ubar ,  Jaan Raik ,  Heinrich Theodor Vierhaus ,  In Lee
Publisher:   IGI Global
ISBN:  

9781609602123


Pages:   350
Publication Date:   30 December 2010
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Design and Test Technology for Dependable Systems-on-Chip


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Overview

"Covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined """"classical"""" design and test topics and solutions for IC test technology and fault-tolerant systems."

Full Product Details

Author:   Raimund Ubar ,  Jaan Raik ,  Heinrich Theodor Vierhaus ,  In Lee
Publisher:   IGI Global
Imprint:   IGI Global
Dimensions:   Width: 21.60cm , Height: 3.10cm , Length: 28.00cm
Weight:   1.650kg
ISBN:  

9781609602123


ISBN 10:   1609602129
Pages:   350
Publication Date:   30 December 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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