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OverviewDesigning reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined classical design and test topics and solutions for IC test technology and fault-tolerant systems. Full Product DetailsAuthor: Raimund Ubar (Tallinn University of Technology, Estonia) , Jaan Raik (Tallinn University of Technology, Estonia) , Heinrich Theodor Vierhaus (Brandenburg University of Technology Cottbus, Germany) , Raimund Ubar (Tallinn University of Technology, Estonia)Publisher: Information Science Reference Imprint: Information Science Reference ISBN: 9781283019736ISBN 10: 1283019736 Pages: 579 Publication Date: 01 January 2010 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: In stock  We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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