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OverviewThis book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples. Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability. Full Product DetailsAuthor: Nobuyasu Kanekawa , Eishi H. Ibe , Takashi Suga , Yutaka UematsuPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2011 ed. Dimensions: Width: 15.50cm , Height: 1.20cm , Length: 23.50cm Weight: 0.454kg ISBN: 9781489985941ISBN 10: 1489985948 Pages: 204 Publication Date: 09 October 2014 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand We will order this item for you from a manufactured on demand supplier. Table of ContentsIntroduction.- Terrestrial Neutron-Induced Failures in Semiconductor Devices and Relevant Systems.- Electromagnetic Compatibility; Power Integrity.- Dependable System Technology.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |