Delay Fault Testing for VLSI Circuits
Author:   Angela Krstic ,  Kwang-Ting (Tim) Cheng
Publisher:   Kluwer Academic Publishers
Edition:   1998 ed.
Volume:   14
ISBN:  

9780792382959


Pages:   191
Publication Date:   31 October 1998
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Our Price $409.20 Quantity:  
Add to Cart

Share |

Delay Fault Testing for VLSI Circuits


Overview

Full Product Details

Author:   Angela Krstic ,  Kwang-Ting (Tim) Cheng
Publisher:   Kluwer Academic Publishers
Imprint:   Kluwer Academic Publishers
Edition:   1998 ed.
Volume:   14
Dimensions:   Width: 15.50cm , Height: 1.20cm , Length: 23.50cm
Weight:   1.050kg
ISBN:  

9780792382959


ISBN 10:   0792382951
Pages:   191
Publication Date:   31 October 1998
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Reviews

Author Information

Tab Content 6

Author Website:  

Countries Available

All regions
Latest Reading Guide

SEPRG2025

 

Shopping Cart
Your cart is empty
 Shopping cart
Mailing List

 

Sign up now