Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Author:   Manoj Sachdev
Publisher:   Springer Us
Edition:   2nd
ISBN:  

9781280938214


Pages:   328
Publication Date:   01 January 2007
Format:   Undefined
Availability:   In stock   Availability explained
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits


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Author:   Manoj Sachdev
Publisher:   Springer Us
Imprint:   Springer Us
Edition:   2nd
ISBN:  

9781280938214


ISBN 10:   1280938218
Pages:   328
Publication Date:   01 January 2007
Audience:   General/trade ,  General
Format:   Undefined
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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