Debug Automation from Pre-Silicon to Post-Silicon

Author:   Mehdi Dehbashi ,  Görschwin Fey
Publisher:   Springer International Publishing AG
Edition:   Softcover reprint of the original 1st ed. 2015
ISBN:  

9783319356105


Pages:   171
Publication Date:   10 September 2016
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Our Price $145.17 Quantity:  
Add to Cart

Share |

Debug Automation from Pre-Silicon to Post-Silicon


Add your own review!

Overview

Full Product Details

Author:   Mehdi Dehbashi ,  Görschwin Fey
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   Softcover reprint of the original 1st ed. 2015
Weight:   3.276kg
ISBN:  

9783319356105


ISBN 10:   3319356100
Pages:   171
Publication Date:   10 September 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Introduction.- Preliminaries.- Part I Debug of Design Bugs.- Automated Debugging for Logic Bugs.- Automated Debugging from Pre-Silicon to Post-Silicon.- Automated Debugging for Synchronization Bugs.- Part II Debug of Delay Faults.- Analyzing Timing Variations.- Automated Debugging for Timing Variations.- Efficient Automated Speedpath Debugging.- Part III Debug of Transactions.- Online Debug for NoC-Based Multiprocessor SoCs.- Summary and Outlook.

Reviews

Author Information

Mehdi Dehbashi received his M.Sc. in computer engineering from Sharif University of Technology, Tehran, Iran, in 2007 and his PhD in computer science from University of Bremen, Bremen, Germany in 2013.  He is currently a researcher with the Group of Cyber-Physical Systems of the German Research Center for Artificial Intelligence (DFKI). His research interests are computer aided design for circuits and systems, dependable embedded systems design, and distributed embedded systems. Goerschwin Fey is a professor for Reliable Embedded Systems at the University of Bremen and heads the Department of Avionics Systems at the Institute of Space Systems of the German Aerospace Center (DLR). He received his Diploma in Computer Science from Martin-Luther-Universität Halle-Wittenberg in 2001 and his PhD in Computer Science from University of Bremen in 2006. Goerschwin published more than 50 papers at international conferences and journals. His research yields advanced tool support for embedded system's design with a focus on automated debugging, diagnosis and design understanding.

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

lgn

al

Shopping Cart
Your cart is empty
Shopping cart
Mailing List