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OverviewThis is a comprehensive resource of power device electrical characteristics in a cryogenic environment. Using theoretical and experimental knowledge, temperature dependence of fundamental silicon material parameters like intrinsic carrier concentration, carrier mobilities, lifetimes and bandgap narrowing was identified. The temperature dependent model of avalanche breakdown was developed using experimental data on numerous devices. A wide range of power devices, each with its own unique features, was chosen for theoretical and experimental analysis. Using these analyses, Schottky diodes, power MOSFETs, power BJTs, and power JFETs were optimized in the 300-77K temperature range. This text presents the different characteristics of power devices operated below -55`C (220K). It provides data and physics based models for power devices operated at temperatures down to 77K in a single source. All commercially available devices have been included to provide comprehensive coverage. Also, a fundamental analysis of devices identifies the suitability of various devices to applications requiring cryogenic operations. A quantitative analysis of the relative strengths and weaknesses of these devices is also presented. Full Product DetailsAuthor: Ranbir Singh , B. Jayant BaligaPublisher: Springer Imprint: Springer Edition: 1998 ed. Volume: v. 445 Dimensions: Width: 15.50cm , Height: 1.10cm , Length: 23.50cm Weight: 0.930kg ISBN: 9780792381570ISBN 10: 0792381572 Pages: 148 Publication Date: 31 May 1998 Audience: Professional and scholarly , General/trade , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of Contents1. Introduction.- 1.1 Advent of Power Cryoelectronics.- 1.2 Cryogenic Power Applications.- 1.3 Advantages of using semiconductor devices at low temperatures.- 1.4 Inferences and Objectives.- 2. Temperature Dependence of Silicon Properties.- 2.1 Semiconductor statistics and carrier Freezeout.- 2.2 Energy bandgap of Silicon.- 2.3 Intrinsic Carrier Concentration.- 2.4 Carrier Mobility.- 2.5 Carrier Lifetime.- 2.6 Breakdown Phenomenon.- 3. Schottky Barrier Diodes.- 3.1 Device Operation.- 3.2 Experimental Results.- 3.3 Optimization of Schottky Barrier Diodes for low temperature operation.- 3.4 Conclusions.- 4. P-I-N Diode.- 4.1 Basic Structure.- 4.2 Experimental Results.- 4.3 Analytical Modeling.- 4.4 Conclusions.- 5. Power Bipolar Transistors.- 5.1 Basic Operation.- 5.2 Experimental Results.- 5.3 Emitter Current Crowding.- 5.4 Transistor Optimization.- 5.5 Conclusions.- 6. Power Mosfets.- 6.1 Device Operation.- 6.2 Carrier freezeout in silicon.- 6.3 Experimental Results.- 6.4 Discussion.- 6.5 Conclusion.- 7. Insulated Gate Bipolar Transistors.- 7.1 Device operation.- 7.2 Experimental results.- 7.3 Conclusion.- 8. Power Junction Field Effect Transistors.- 8.1 Basic Operation.- 8.2 Forward Blocking.- 8.3 Forward Conduction.- 8.4 Conclusions.- 9. Asymmetric Field Controlled Thyristors.- 9.1 Basic Operation.- 9.2 Static Characteristics.- 9.3 Switching Characteristics.- 9.4 Trade-Off curve and Conclusions.- 10. Thyristors.- 10.1 Basic Operation.- 10.2 Static Characteristics.- 10.3 Switching Characteristics.- 10.4 Conclusions.- 11. Synopsis.- 11.1 Design considerations for power devices at 77K.- 11.2 Performance of power devices at 77K.- 11.3 Power devices for cryogenic applications.- References.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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