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OverviewCMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range. Full Product DetailsAuthor: Manjul Bhushan , Mark B. KetchenPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2015 ed. Dimensions: Width: 15.50cm , Height: 2.50cm , Length: 23.50cm Weight: 7.804kg ISBN: 9781493913480ISBN 10: 1493913484 Pages: 424 Publication Date: 04 December 2014 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsReviewsAuthor InformationManjul Bhushan is a technical consultant in New York. Mark Ketchen is a technical consultant in Massachusetts. Tab Content 6Author Website:Countries AvailableAll regions |
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