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OverviewCMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies. Full Product DetailsAuthor: Andrei Pavlov , Manoj SachdevPublisher: Springer Imprint: Springer Edition: Softcover reprint of hardcover 1st ed. 2008 Volume: 40 Dimensions: Width: 15.50cm , Height: 1.10cm , Length: 23.50cm Weight: 0.454kg ISBN: 9789048178551ISBN 10: 904817855 Pages: 194 Publication Date: 28 October 2010 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of Contentsand Motivation.- SRAM Circuit Design and Operation.- SRAM Cell Stability: Definition, Modeling and Testing.- Traditional SRAM Fault Models and Test Practices.- Techniques for Detection of SRAM Cells with Stability Faults.- Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques.ReviewsAuthor InformationProf. Sachdev has authored several successful books with Springer Tab Content 6Author Website:Countries AvailableAll regions |
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