CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test
Author:   Andrei Pavlov ,  Manoj Sachdev
Publisher:   Springer
ISBN:  

9781281492234


Pages:   193
Publication Date:   01 January 2008
Format:   Undefined
Availability:   In stock   Availability explained
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CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware Sram Design and Test


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Overview

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

Full Product Details

Author:   Andrei Pavlov ,  Manoj Sachdev
Publisher:   Springer
Imprint:   Springer
ISBN:  

9781281492234


ISBN 10:   128149223
Pages:   193
Publication Date:   01 January 2008
Audience:   General/trade ,  General
Format:   Undefined
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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