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OverviewThis book covers one of the most important device architectures that have been widely researched to extend the transistor scaling: FinFET. Starting with theory, the book discusses the advantages and the integration challenges of this device architecture. It addresses in detail the topics such as high-density fin patterning, gate stack design, and source/drain engineering, which have been considered challenges for the integration of FinFETs. The book also addresses circuit-related aspects, including the impact of variability on SRAM design, ESD design, and high-T operation. It discusses a new device concept: the junctionless nanowire FET. Full Product DetailsAuthor: Nadine Collaert (IMEC, Leuven, Belgium) , Nadine Collaert (IMEC, Leuven, Belgium)Publisher: Pan Stanford Imprint: Pan Stanford ISBN: 9781322633251ISBN 10: 1322633258 Pages: 444 Publication Date: 01 January 2012 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: In stock  We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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