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OverviewThis book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management. Full Product DetailsAuthor: Ricardo Reis , Yu Cao , Gilson WirthPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2015 ed. Dimensions: Width: 15.50cm , Height: 1.80cm , Length: 23.50cm Weight: 0.604kg ISBN: 9781461440772ISBN 10: 1461440777 Pages: 272 Publication Date: 08 November 2014 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsIntroduction.- Recent Trends in Bias Temperature Instability.- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability.- Atomistic Simulations on Reliability.- On-chip characterization of statistical device degradation.- Circuit Resilience Roadmap.- Layout Aware Electromigration Analysis of Power/Ground Networks.- Power-Gating for Leakage Control and Beyond.- Soft Error Rate and Fault Tolerance Techniques for FPGAs.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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