Characterization of Wide Bandgap Power Semiconductor Devices

Author:   Fei Wang (Professor, University of Tennessee, Knoxville, USA) ,  Zheyu Zhang (Lead Power Electronics Engineer, General Electric Global Research, USA) ,  Edward A. Jones (Senior Applications Engineer, Efficient Power Conversion Corporation, USA)
Publisher:   Institution of Engineering and Technology
ISBN:  

9781785614910


Pages:   347
Publication Date:   31 October 2018
Format:   Hardback
Availability:   In Print   Availability explained
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Characterization of Wide Bandgap Power Semiconductor Devices


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Author:   Fei Wang (Professor, University of Tennessee, Knoxville, USA) ,  Zheyu Zhang (Lead Power Electronics Engineer, General Electric Global Research, USA) ,  Edward A. Jones (Senior Applications Engineer, Efficient Power Conversion Corporation, USA)
Publisher:   Institution of Engineering and Technology
Imprint:   Institution of Engineering and Technology
ISBN:  

9781785614910


ISBN 10:   1785614916
Pages:   347
Publication Date:   31 October 2018
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Chapter 1: Introduction Chapter 2: Pulsed static characterization Chapter 3: Junction capacitance characterization Chapter 4: Fundamentals of dynamic characterization Chapter 5: Gate drive for dynamic characterization Chapter 6: Layout design and parasitic management Chapter 7: Protection design for double pulse test Chapter 8: Measurement and data processing for dynamic characterization Chapter 9: Cross-talk consideration Chapter 10: Impact of three-phase system Chapter 11: Topology consideration Appendix A: Recommended equipment and components list for DPT setup Appendix B: Data processing code for dynamic characterization

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Fei (Fred) Wang is Professor of Electrical Engineering and Condra Chair of Excellence in Power Electronics, and Technical Director of NSF/DOE Engineering Research Center CURENT at The University of Tennessee, Knoxville, USA. He also holds a joint appointment with Oak Ridge National Lab. Prof. Wang has published over 400 journal and conference papers, authored 3 book chapters, and holds 15 US patents. He is a fellow of IEEE and NAI. Zheyu Zhang is a Lead Power Electronics Engineer with General Electric Global Research. He was a Research Assistant Professor at the University of Tennessee, Knoxville from 2015 to 2018. He has published over 60 papers in the most prestigious journals and conference proceedings, four patent applications with one licensed, and two IEEE tutorial seminars. He was the recipient of two IEEE prize paper awards. Edward A. Jones is a Senior Applications Engineer with Efficient Power Conversion Corporation. He completed his Ph.D. at The University of Tennessee, where he was a Chancellor's Fellow, a CURENT Fellow, and a Bredesen Energy Sciences and Engineering Fellow. He has published over 20 peer-reviewed IEEE papers, an IEEE tutorial seminar, and a patent.

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