Characterization of Semiconductor Materials, Volume 1: Principles and Methods
Author:   Gary F. McGuire (MCNC, Electronic Technologies Division, Research Triangle Park, NC)
Publisher:   William Andrew Publishing
ISBN:  

9780815512004


Pages:   342
Publication Date:   31 December 1989
Format:   Hardback
Availability:   In Print   Availability explained
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.

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Characterization of Semiconductor Materials, Volume 1: Principles and Methods


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Author:   Gary F. McGuire (MCNC, Electronic Technologies Division, Research Triangle Park, NC)
Publisher:   William Andrew Publishing
Imprint:   William Andrew Publishing
Dimensions:   Width: 15.20cm , Height: 2.00cm , Length: 22.90cm
Weight:   0.760kg
ISBN:  

9780815512004


ISBN 10:   0815512007
Pages:   342
Publication Date:   31 December 1989
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Out of Print
Availability:   In Print   Availability explained
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.

Table of Contents

Electrical Characterization of Semiconductor Materials and Devices Secondary Ion Mass Spectrometry Photoelectron Spectroscopy: Applications to Semiconductors Ion/Solid Interaction in Surface Analysis Molecular Characterization of Dielectric Films by Laser Raman Spectroscopy Characterization of Semiconductors Surfaces by Appearance Potential Spectroscopy References Index

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