Free Delivery Over $100
|
|
|||
|
||||
OverviewThis handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing. Full Product DetailsAuthor: Paul H. Bardell (IBM Corporation, Armonk, NY) , W. H. McAnney (IBM Corporation, Armonk, NY) , J. Savir (IBM Corporation, Armonk, NY) , J. SavirPublisher: John Wiley & Sons Inc Imprint: Wiley-Interscience Dimensions: Width: 16.50cm , Height: 2.30cm , Length: 24.00cm Weight: 0.610kg ISBN: 9780471624639ISBN 10: 0471624632 Pages: 368 Publication Date: 02 December 1987 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Out of stock  The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviewsAuthor InformationPaul H. Bardell and W. H. McAnney are the authors of Built In Test for VLSI: Pseudorandom Techniques, published by Wiley. Tab Content 6Author Website:Countries AvailableAll regions |
||||
