Built-In-Self-Test and Digital Self-Calibration for RF Socs
Author:   Matthew Marsh
Publisher:   Createspace Independent Publishing Platform
ISBN:  

9781978061897


Publication Date:   08 May 2017
Format:   Paperback
Availability:   In stock   Availability explained
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Built-In-Self-Test and Digital Self-Calibration for RF Socs


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Overview

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.

Full Product Details

Author:   Matthew Marsh
Publisher:   Createspace Independent Publishing Platform
Imprint:   Createspace Independent Publishing Platform
Dimensions:   Width: 21.60cm , Height: 0.50cm , Length: 28.00cm
Weight:   0.245kg
ISBN:  

9781978061897


ISBN 10:   1978061897
Publication Date:   08 May 2017
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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