Boundary-Scan Interconnect Diagnosis

Author:   José T. de Sousa ,  Peter Y.K. Cheung
Publisher:   Springer
Edition:   2001 ed.
Volume:   18
ISBN:  

9780792373148


Pages:   168
Publication Date:   28 February 2001
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Our Price $604.56 Quantity:  
Add to Cart

Share |

Boundary-Scan Interconnect Diagnosis


Add your own review!

Overview

This title explains how to synthesize digital diagnostic sequences for wire interconnects using boundary-scan, and how to assess the quality of those sequences. Its importance has to do with designing complex electronic systems using pre-designed intellectual property (IP) cores, which is becoming increasingly popular. Since tests for pre-designed cores can be supplied with the cores themselves, the only additional tests that need to be developed to test and diagnose the entire system are those for wire interconnects between the cores. Besides the trivial solutions that are often used to solve this problem, there are many more methods that enable significant optimizations of test vector length and/or diagnostic resolution. The book surveys all existing methods of this kind and proposes new ones. In the new approach circuit and interconnect faults are carefully modeled, and graph techniques are applied to solve the problem. The original feature of the new method is the fact that it can be adjusted to provide shorter test sequences and/or greater diagnostic resolution. The effectiveness of existing and proposed methods is then evaluated using real electronic assemblies and published statistical data for an actual manufacturing process from HP.

Full Product Details

Author:   José T. de Sousa ,  Peter Y.K. Cheung
Publisher:   Springer
Imprint:   Springer
Edition:   2001 ed.
Volume:   18
Dimensions:   Width: 15.50cm , Height: 1.20cm , Length: 23.50cm
Weight:   1.000kg
ISBN:  

9780792373148


ISBN 10:   0792373146
Pages:   168
Publication Date:   28 February 2001
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Interconnect Circuit and Fault Models.- Behavioral Interconnect Diagnosis.- Structural Interconnect Diagnosis.- Diagnostic Resolution Assessment.- Experimental Results.- Conclusion.

Reviews

Author Information

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

lgn

al

Shopping Cart
Your cart is empty
Shopping cart
Mailing List