Overview

Written as a tutorial guide for newcomers to the field of surface analysis, this work is the first book ever published to feature photon, electron, and ion beam effects and beam damage to solids during surface and near-surface analysis and depth profiling. This introductory text describes the principles, techniques, and methods vital for efficient surface analysis. A wealth of practical information is assembled in this single volume, including summary tables, extensive references, and 251 illustrative figures.

Full Product Details

Author:   Alvin W. Czanderna ,  Theodore E. Madey ,  Cedric J. Powell
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   1st ed. Softcover of orig. ed. 1999
Volume:   5
Dimensions:   Width: 15.20cm , Height: 2.30cm , Length: 22.90cm
Weight:   1.390kg
ISBN:  

9781441932990

ISBN 10:   1441932992
Pages:   430
Publication Date:   06 December 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print  
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Table of Contents

Photon Beam Damage and Charging at Solid Surfaces.- Electron Beam Damage at Solid Surfaces.- Ion Beam Bombardment Effects on Solid Surfaces at Energies Used for Sputter Depth Profiling.- Characterization of Surface Topography.- Depth Profiling Using Sputtering Methods.

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