Analytical Techniques for the Characterization of Compound Semiconductors

Author:   G Bastard ,  H Oppolzer
Publisher:   North-Holland
ISBN:  

9781299617483


Pages:   554
Publication Date:   01 January 1991
Format:   Electronic book text
Availability:   In stock   Availability explained
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Analytical Techniques for the Characterization of Compound Semiconductors


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Overview

This volume is a collection of 96 papers presented at the above Conference. The scope of the work includes optical and electrical methods as well as techniques for structural and compositional characterization. The contributed papers report on topics such as X-ray diffraction, TEM, depth profiling, photoluminescence, Raman scattering and various electrical methods. Of particular interest are combinations of different techniques providing complementary information. The compound semiconductors reviewed belong mainly to the III-V and III-VI families. The papers in this volume will provide a useful reference on the implications of new technologies in the characterization of compound semiconductors.

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Author:   G Bastard ,  H Oppolzer
Publisher:   North-Holland
Imprint:   North-Holland
ISBN:  

9781299617483


ISBN 10:   1299617484
Pages:   554
Publication Date:   01 January 1991
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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