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OverviewThis book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs. Full Product DetailsAuthor: Elie Maricau , Georges GielenPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2013 ed. Dimensions: Width: 15.50cm , Height: 1.80cm , Length: 23.50cm Weight: 4.498kg ISBN: 9781461461623ISBN 10: 1461461626 Pages: 198 Publication Date: 09 January 2013 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsIntroduction.- CMOS Reliability Overview.- Transistor Aging Compact Modeling.- Background on IC Reliability Simulation.- Analog IC Reliability Simulation.- Integrated Circuit Reliability.- Conclusions.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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