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OverviewThe ""Mixed-Signal Boundary-Scan Test Bus"" is the natural complement to the widely used ""Boundary-Scan IEEE Std. 1149.1"", commonly known as JTAG. This new mixed-signal standard is called ""IEEE Standard 1149.4"" and is mainly dedicated to the manufacturing test of analog and mixed-signal boards. But like the IEEE 1149.1 it can be used for many other purposes: the test buses and their digital control form a very general ""analog data highway"". Increasingly, mixed-signal boards are gaining complexity, making their testing process extremely challenging. At the same time, IC complexity and technology are getting so sophisticated that testing ICs at the board level becomes very expensive. Embedding a part of the board tester on chip is the aim of the IEEE 1149.4. This is a treatment of the design, application and structure of the IEEE 1149.4. It updates the information on digital boundary-scan and addresses chip designers in a dedicated chapter containing guidance to easily build analog circuits including IEEE 1149.4. A basic metrology and a test strategy with the instrumentation needed for it are also described. Full Product DetailsAuthor: Adam OsseiranPublisher: Springer Imprint: Springer Edition: 1999 ed. Volume: 16 Dimensions: Width: 15.60cm , Height: 1.10cm , Length: 23.40cm Weight: 0.940kg ISBN: 9780792386865ISBN 10: 0792386868 Pages: 156 Publication Date: 31 October 1999 Audience: Professional and scholarly , General/trade , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print  This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of Contents1 Introduction to the IEEE 1149.4.- 2 The Boundary-Scan Standard.- 3 IEEE 1149.4 Architecture and Instruction Set.- 4 System Test Methodologies Using IEEE 1149.4.- 5 Peripheral Cell Design for IEEE 1149.4.- 6 Structural Testing.ReviewsAuthor InformationAdam Osseiran is Professor of Electrical Engineering at the Engineering Institute of Geneva, Switzerland and the European Design and Test Specialist at Fluence Technology Inc., Beaverton, Oregon, USA. He is the present Chair of the IEEE 1149.4 Working Group. Tab Content 6Author Website:Countries AvailableAll regions |
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