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OverviewFull Product DetailsAuthor: Ian A. GroutPublisher: Springer London Ltd Imprint: Springer London Ltd Edition: 2006 ed. Dimensions: Width: 15.50cm , Height: 2.10cm , Length: 23.50cm Weight: 0.605kg ISBN: 9781846280238ISBN 10: 1846280230 Pages: 362 Publication Date: 22 August 2005 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Paperback Publisher's Status: Active Availability: Out of stock  The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of Contentsto Integrated Circuit Test Engineering.- Fabrication Processes for Integrated Circuits.- Digital Logic Test.- Memory Test.- Analogue Test.- Mixed-Signal Test.- Input-Output Test.- Design for Testability — Structured Test Approaches.- System on a Chip (SoC) Test.- Test Pattern Generation and Fault Simulation.- Automatic Test Equipment (ATE) and Production Test.- Test Economics.ReviewsAuthor InformationDoctor Ian Grout is a lecturer within the Department of Electronic and Computer Engineering at the University of Limerick. His research interests include microelectronic circuit design, control systems applications, design for test (digital and mixed-signal), test technology, CAD tool development and interfacing. He currently teaches microelectronic circuit design for electronic engineering students and test engineering for the final year electronic systems and VLSI Masters students. He is also the course leader for the Electronic Systems undergraduate programme within the university. Doctor Grout has previously held positions with the UK Ministry of Defence and Defence Research Agency. He is currently the chair of the Educational ECAD (Electronic Computer Aided Design) User Group, UK, http://www.eeug.org.uk. Tab Content 6Author Website:Countries AvailableAll regions |
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