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OverviewAdvances in Imaging and Electron Physics, Volume 202, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Full Product DetailsAuthor: Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France) , Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France) , Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France) , Peter W. Hawkes (Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France)Publisher: Elsevier Science Publishing Co Inc Imprint: Academic Press Inc Edition: 165th edition Volume: 165 Weight: 0.450kg ISBN: 9780128120880ISBN 10: 0128120886 Pages: 166 Publication Date: 30 August 2017 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of Contents1. Non-Negative Sparse Mathematical Morphology Jesus Angulo and Santiago Velasco-Forero 2. Disorder Modifications of the Critical Temperature for Superconductivity - A Perspective from the Point of View of Nanoscience Clifford M. Krowne 3. The Struggle to Overcome Spherical Aberration in Electron Optics Albert SeptierReviewsAuthor InformationPeter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics. Tab Content 6Author Website:Countries AvailableAll regions |
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