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OverviewModern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called ""static faults,"" but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as ""dynamic faults"", are not covered by classical test solutions and require the dedicated test sequences presented in this book. Full Product DetailsAuthor: Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge PravossoudovitchPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2010 ed. Dimensions: Width: 15.50cm , Height: 1.00cm , Length: 23.50cm Weight: 0.454kg ISBN: 9781489983145ISBN 10: 1489983147 Pages: 171 Publication Date: 03 September 2014 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand  We will order this item for you from a manufactured on demand supplier. Table of ContentsBasics on SRAM Testing.- Resistive-Open Defects in Core-Cells.- Resistive-Open Defects in Pre-charge Circuits.- Resistive-Open Defects in Address Decoders.- Resistive-Open Defects in Write Drivers.- Resistive-Open Defects in Sense Amplifiers.- Faults Due to Process Variations in SRAMs.- Diagnosis and Design-for-Diagnosis.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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