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OverviewModern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called static faults, but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as dynamic faults, are not covered by classical test solutions and require the dedicated test sequences presented in this book. Full Product DetailsAuthor: Alberto Bosio , Luigi Dilillo , Patrick Girard, PH.Publisher: Springer Imprint: Springer Dimensions: Width: 23.40cm , Height: 1.00cm , Length: 15.60cm Weight: 0.272kg ISBN: 9781441909398ISBN 10: 1441909397 Pages: 188 Publication Date: 09 October 2009 Audience: General/trade , General Format: Undefined Publisher's Status: Unknown Availability: Out of stock  Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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