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OverviewTaken from the proceedings of the 2003 International Conference of the Simulation of Semiconductor Processes and Devices (SISPAD 2003), this volume looks at electron devices. Full Product DetailsAuthor: IEEE , International Conference on Simulation of Semiconductor Processes and Devices (2003 BostPublisher: I.E.E.E.Press Imprint: I.E.E.E.Press Dimensions: Width: 21.60cm , Height: 1.80cm , Length: 27.90cm ISBN: 9780780378261ISBN 10: 0780378261 Pages: 300 Publication Date: 01 September 2003 Audience: College/higher education , Professional and scholarly , Tertiary & Higher Education , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: To order  Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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