2000 European Test Workshop (Etw) IEEE Postproceed
Author:   IEEE
Publisher:   IEEE Computer Society Press,U.S.
Edition:   2000 ed.
ISBN:  

9780769507019


Pages:   181
Publication Date:   01 November 2000
Format:   Paperback
Availability:   In Print   Availability explained
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2000 European Test Workshop (Etw) IEEE Postproceed


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Overview

The 25 papers cover delay testing and test scheduling, scan and functional testing, system testing, quiescent current testing, analog and mixed-signal testing, core-based testing, fault simulation and field programmable gate array testing, challenges in deep sub-micron testing, high level tests, mem

Full Product Details

Author:   IEEE
Publisher:   IEEE Computer Society Press,U.S.
Imprint:   IEEE Computer Society Press,U.S.
Edition:   2000 ed.
ISBN:  

9780769507019


ISBN 10:   0769507018
Pages:   181
Publication Date:   01 November 2000
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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